The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2013
Filed:
Sep. 02, 2011
Petrus J. L. Van Beek, Camas, WA (US);
Chang Yuan, Vancouver, WA (US);
Xinyu Xu, Vancouver, WA (US);
Xiaofan Feng, Camas, WA (US);
Xiaofeng Fan, Billerica, MA (US);
Petrus J. L. Van Beek, Camas, WA (US);
Chang Yuan, Vancouver, WA (US);
Xinyu Xu, Vancouver, WA (US);
Xiaofan Feng, Camas, WA (US);
Xiaofeng Fan, Billerica, MA (US);
Sharp Laboratories of America, Inc., Camas, WA (US);
Abstract
A method for image processing that includes determining edge pixels of a model image using an edge based technique, and an angular orientation for each of the edge pixels of the model image. The method determines a lower spatial resolution model image based upon the model image and determining respective angular orientations for the lower spatial resolution model image. The method determines edge pixels of an input image using an edge based technique, and an angular orientation for each of the edge pixels of the input image. The method determines a lower spatial resolution input image based upon the input image and determining respective angular orientations for the lower spatial resolution input image. The method matches the lower spatial resolution model image with the lower spatial resolution input image to determine candidate locations of an object within the input image and based upon the candidate locations matching the input image with the model image.