The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2013
Filed:
Jun. 13, 2008
Tetsuro Aikawa, Yokohama, JP;
Yoshinori Satoh, Kawasaki, JP;
Tatsuya Oodake, Zushi, JP;
Naruhiko Mukai, Yokohama, JP;
Hisashi Hozumi, Ota-ku, JP;
Yasuhiro Yuguchi, Yokohama, JP;
Tetsuro Aikawa, Yokohama, JP;
Yoshinori Satoh, Kawasaki, JP;
Tatsuya Oodake, Zushi, JP;
Naruhiko Mukai, Yokohama, JP;
Hisashi Hozumi, Ota-ku, JP;
Yasuhiro Yuguchi, Yokohama, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
An apparatus for inspecting and measuring an object to be measured includes: a distance measurement device having a light projector that projects a two-dimensional optical pattern onto a measurement target of the measurement object, imaging devices disposed in a stereoscopic arrangement that image the measurement object, and a driving device that rotates a posture of at least one of the imaging devices to control a parallax angle between the imaging devices; a working distance control device that controls the driving device and adjusts a position at which optical axes of the imaging devices intersect; and a distance calculation device having a correspondence position calculation device that determines a correspondence position at which the same region is imaged among images of the imaging devices, and a distance calculation devices that calculates a distance to the measurement target of the measurement object based on a calculation result of the calculation device.