The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2013

Filed:

Feb. 15, 2008
Applicants:

Junichi Takiguchi, Tokyo, JP;

Naoyuki Kajiwara, Tokyo, JP;

Yoshihiro Shima, Tokyo, JP;

Ryujiro Kurosaki, Tokyo, JP;

Takumi Hashizume, Tokyo, JP;

Inventors:

Junichi Takiguchi, Tokyo, JP;

Naoyuki Kajiwara, Tokyo, JP;

Yoshihiro Shima, Tokyo, JP;

Ryujiro Kurosaki, Tokyo, JP;

Takumi Hashizume, Tokyo, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

It is an object to measure a position of a feature around a road. An image memory unit stores images in which neighborhood of the road is captured. Further, a three-dimensional point cloud model memory unitstores a point cloud showing three-dimensional coordinates obtained by laser measurement which is carried out simultaneously to the image-capturing of the images as a road surface shape model. A model projecting unitprojects a point cloud on the image, and an image displaying unitdisplays the point cloud superimposed with the image on the displaying device. Using an image point inputting unit, a pixel on a feature of a measurement target is specified by a user as a measurement image point. A neighborhood extracting unitextracts a point which is located adjacent to the measurement image point and superimposed on the feature for the measurement target from the point cloud. A feature position calculating unitoutputs three-dimensional coordinates shown by the extracted point as three-dimensional coordinates of the feature for the measurement target.


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