The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2013
Filed:
Sep. 17, 2010
John Brandon Laflen, Niskayuna, NY (US);
Glen William Brooksby, Glenville, NY (US);
Robert A. Kaucic, Niskayuna, NY (US);
John Brandon Laflen, Niskayuna, NY (US);
Glen William Brooksby, Glenville, NY (US);
Robert A. Kaucic, Niskayuna, NY (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
A system for detecting faint perturbations of interest in an image is described. The system includes a memory comprising the image, and a processor. The processor is configured to estimate a local mean and variance for each of a plurality of pixels in the image, analyze a local region of the image, an image mean, and an image variance using a filter bank, thereby generating a plurality of response vectors, determine a likelihood of a local perturbation in the image using a probability distribution based on the plurality of response vectors, and make a classification decision of the local perturbation. The probability distribution is calculated, for each of the plurality of response vectors, based on a response of each of the plurality of response vectors to the estimated local mean and variance for each of the plurality of pixels. Methods and machine-readable media are also described.