The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2013

Filed:

Sep. 28, 2010
Applicants:

Lei Yang, Gainsville, FL (US);

Jun Tian, Belle Meade, NJ (US);

Dapeng Oliver Wu, Gainesville, FL (US);

Hong Heather Yu, West Windsor, NJ (US);

Inventors:

Lei Yang, Gainsville, FL (US);

Jun Tian, Belle Meade, NJ (US);

Dapeng Oliver Wu, Gainesville, FL (US);

Hong Heather Yu, West Windsor, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

In accordance with an embodiment, a method of authenticating images includes electronically receiving an anchor image and a query image, performing a feature point extraction of an anchor image, and performing a feature point extraction of a query image. The method also includes clustering feature points of the anchor image and feature points of the query image, where clustering includes determining matching feature points, determining outlier feature points, and excluding outlier feature points. Whether the anchor image is similar to the query image is determined based on a distance between the feature points of the anchor image and the feature points of the query image. If the anchor image is similar to the query image, possible tampered areas of the query image based on the outlier feature points are identified.


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