The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2013

Filed:

Dec. 22, 2010
Applicants:

Paavana Sainath, Oconomowoc, WI (US);

Xiaoye Wu, Rexford, NY (US);

Girijesh K. Yadava, Milwaukee, WI (US);

Inventors:

Paavana Sainath, Oconomowoc, WI (US);

Xiaoye Wu, Rexford, NY (US);

Girijesh K. Yadava, Milwaukee, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 35/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Anode targets for an x-ray tube and methods for controlling x-ray tubes for x-ray systems are provided. One x-ray system includes a field-generator configured to generate a field, an electron beam generator configured to generate an electron beam directed towards a target and a voltage controller configured to control the electron beam generator to produce an electron beam at a first energy level and an electron beam at a second energy level. The x-ray system also includes a field-generator controller configured to control a field to deflect at least one of the electron beams, wherein the electron beam, at the first energy level, impinges on the target at a first contact position and the electron beam, at the second energy level, impinges on the target at a second contact position. The at the first contact position and at the second contact position is configured to filter x-rays.


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