The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2013

Filed:

Sep. 10, 2010
Applicants:

Yasushi Ichizawa, Musashino, JP;

Hirohiko Obinata, Musashino, JP;

Inventors:

Yasushi Ichizawa, Musashino, JP;

Hirohiko Obinata, Musashino, JP;

Assignee:

Yokogawa Electric Corporation, Musashino-Shi, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/083 (2006.01);
U.S. Cl.
CPC ...
Abstract

A radiation inspection apparatus includes a conveying unit configured to convey a sheet-like sample, a radiation source configured to emit radiation to the sheet-like sample, a line sensor configured to measure a physical property of the sheet-like sample, the liner sensor disposed to be opposed to the radiation source across the sheet-like sample, and a gas ejecting unit configured to eject gas to the sheet-like sample to reduce vertical conveyance swinging produced by a tension of the sheet-like sample, the gas ejecting unit placed in close proximity to at least one side face of the line sensor.


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