The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2013

Filed:

Mar. 26, 2008
Applicants:

Hiroyuki Kawano, Tokyo, JP;

Tatsuki Okamoto, Tokyo, JP;

Tomotaka Katsura, Tokyo, JP;

Junichi Nishimae, Tokyo, JP;

Inventors:

Hiroyuki Kawano, Tokyo, JP;

Tatsuki Okamoto, Tokyo, JP;

Tomotaka Katsura, Tokyo, JP;

Junichi Nishimae, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image-scanning device wherein plural images of an object are picked up inverted and reduced in size by image-forming optical systems arranged to be adjacent to each other, and then restored by an image processing system. Each optical system includes a first optical element having a first focal length; an aperture member located at a focus position in a rear side of the first optical element; and a second optical element provided in a rear side of the aperture member and having a second focal length shorter than the first focal length, respectively disposed from a side of the object being picked up to a side of the image pickup device. In between optical systems, corresponding image pick up devices thereof are arranged to be adjacent to each other, the image pickup devices including a region in which the images picked up by the image pickup devices are overlapped.


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