The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2013

Filed:

Jan. 29, 2010
Applicant:

Takanori Iwawaki, Hachioji, JP;

Inventor:

Takanori Iwawaki, Hachioji, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measuring apparatus includes a filter that transmits light of a predetermined wavelength; a first light receiving unit receives at least one of a first light that is output from a first light source, reflected by or transmitted through an object to be measured, and transmitted through the filter and a second light that is output from a second light source, reflected by or transmitted through the object to be measured, and transmitted through the filter, and through which a signal according to the received light travels; a second light receiving unit receives light of a different path from that received by the first light receiving unit; a difference extracting unit that obtains a difference signal between the signals traveling through the first and second light receiving units and an information generating unit that generates information of the object to be measured based on the difference signal.


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