The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2013
Filed:
Dec. 27, 2011
Ken Tsukii, Tokyo, JP;
Kenichi Kimura, Tokyo, JP;
Toru Takahashi, Tokyo, JP;
Jie Xu, Tokyo, JP;
Furukawa Electric Co., Ltd., Tokyo, JP;
Abstract
An optical information analyzer () includes a light emitting unit () that emits light (excitation light) (L) to a sample (S), a transmission light receiving unit () that receives transmission light (L), which is the excitation light passing through the sample (S), and detects the received transmission light as a transmission light signal (SG), scattered light/fluorescence receiving units () and () that are provided at a plurality of positions, receive side scattered light/fluorescence components (L) and (L) from the sample (S), and detect the received side scattered light/fluorescence components as scattered light/fluorescence signals (SG) and (SG), and an analyzing unit () that measures the optical information of the sample (S) on the basis of the detected scattered light/fluorescence signals (SG) and (SG) and the detected transmission light signal (SG) and analyzes the sample (S) on the basis of the measured optical information.