The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2013
Filed:
Nov. 09, 2009
Ki-jae Song, Paju-si, KR;
Hun-kyo Seo, Asan-si, KR;
Jae-il Lee, Yongin-si, KR;
Jong-won Han, Cheonan-si, KR;
Jong-pil Park, Asan-si, KR;
Ki-Jae Song, Paju-si, KR;
Hun-Kyo Seo, Asan-si, KR;
Jae-Il Lee, Yongin-si, KR;
Jong-Won Han, Cheonan-si, KR;
Jong-Pil Park, Asan-si, KR;
Samsung Electronics Co., Ltd, Suwon-si, KR;
Abstract
A connecting unit to test a semiconductor chip and an apparatus to test the semiconductor chip having the same include a plurality of connectors, on which a semiconductor chip having a certain pattern of electrical connection terminals, having a plurality of holes, cables configured to electrically connect the electrical connection terminals to the exterior, and coupling units configured to selectively electrically connect the cables to the electrical connection terminals through the holes. Therefore, it is possible to perform electrical tests of semiconductor chips having various patterns of electrical connection terminals and receive the semiconductor chips in a tray at a time.