The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2013

Filed:

Jun. 23, 2009
Applicants:

Philippe Garreau, Paris, FR;

Per Iversen, Doylestown, PA (US);

Luc Duchesne, Angervilliers, FR;

Arnaud Gandois, Breuillet, FR;

Inventors:

Philippe Garreau, Paris, FR;

Per Iversen, Doylestown, PA (US);

Luc Duchesne, Angervilliers, FR;

Arnaud Gandois, Breuillet, FR;

Assignee:

Microwave Vision, Villebon sur Yvette, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01F 27/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device () for the relative positioning of an electromagnetic probe network () and of an object being tested (). The device includes at least a sliding element () to provide for the relative sliding of the object being tested () or of the electromagnetic probe network (), to move the object being tested () or the probe network () along at least one sliding direction included in a plane of the probe network (), and on which is provided a rotation device () for the relative rotation of the object being tested () and of the probe network () about a main rotation axis perpendicular to the sliding direction.


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