The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2013

Filed:

Jun. 11, 2009
Applicant:

Simon Page, Hadfield, GB;

Inventor:

Simon Page, Hadfield, GB;

Assignee:

Kratos Analytical Limited, Manchester, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 5/00 (2006.01); H01J 37/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides an electron spectroscopy apparatus () comprising a high energy particle source () for irradiating a sample, an electron detector system () (e.g. including a delay line detector) for detecting electrons emitted from the sample and an ion gun () for delivering a polycyclic aromatic hydrocarbon (PAH) ion beam to the sample, wherein the ion gun comprises a polycyclic aromatic hydrocarbon ion source, for example comprising coronene. In an embodiment, the PAH is located in a heated chamber () and vaporised to produce gas phase PAH. The gas phase PAH molecules are then ionised by electron impact, extracted from the ion source via an extraction field and focussed using ion optics. The PAH ion beam can be used for surface cleaning and depth analysis.


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