The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2013

Filed:

Jun. 15, 2006
Applicants:

Nao Honda, Kita-ku, JP;

Satoshi Mori, Kita-ku, JP;

Shuji Tanaka, Sendai, JP;

Masayoshi Esashi, Sendai, JP;

Inventors:

Nao Honda, Kita-ku, JP;

Satoshi Mori, Kita-ku, JP;

Shuji Tanaka, Sendai, JP;

Masayoshi Esashi, Sendai, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for fabricating a micromachine component of resin comprising step (a) of forming a sacrifice layer on a substrate, step (b) of forming at least two photosensitive resin composition layers sequentially on the sacrifice layer, and performing photolithography of each photosensitive resin composition layer to form an air gap portion defining the circumferential edge portion of the micromachine component and an air gap portion where an internal structure of the micromachine component is constituted to form a multilayer structure, step (c) for depositing dry film resist on the multilayer structure of the cured photosensitive resin composition layer, and performing photolithography of the dry film resist layer to form a cured dry film resist layer in which an air gap portion defining the circumferential edge of a shroud layer and an air gap where the structure of the shroud layer is constituted are formed, and step (d) for separating the micromachine component having the multilayer structure of the cured photosensitive resin composition layer and the cured dry film resist layer from the substrate by removing the sacrifice layer.


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