The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2013

Filed:

May. 15, 2007
Applicants:

Shea-yun Lee, Seoul, KR;

Dong-hyun Song, Yongsin-si, KR;

Jang-hwan Kim, Suwon-si, KR;

Sang-lyul Min, Seoul, KR;

Inventors:

Shea-Yun Lee, Seoul, KR;

Dong-Hyun Song, Yongsin-si, KR;

Jang-Hwan Kim, Suwon-si, KR;

Sang-Lyul Min, Seoul, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-Si, Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A memory device detects and correct bit errors. The memory device includes cyclic redundancy check (CRC) and error correction code (ECC) circuits. The CRC circuit generates a write CRC code corresponding to data to be stored in memory cells. The ECC circuit generates an ECC code corresponding to the data and detecting and correcting a bit error of the data by means of the ECC code during a read operation. The CRC circuit generates a read CRC code corresponding to data corrected by the ECC circuit during the read operation, and detects a bit error of the data according to a comparison of the read CRC code and the write CRC code.


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