The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2013
Filed:
Mar. 08, 2010
Hsiu-khuern Tang, San Jose, CA (US);
Justin S. Dyer, Palo Alto, CA (US);
Hsiu-Khuern Tang, San Jose, CA (US);
Justin S. Dyer, Palo Alto, CA (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
System, including method, apparatus, and computer-readable media, for evaluating client status for a likelihood of churn. Client data may be received, with the client data representing events from a set of different event types performed by clients. Parameters of a statistical model that describes client behavior may be estimated using a computer and based on the client data. A churn type of event may be encoded in the statistical model as an absorbing state of a stochastic process, with a time of transition to the absorbing state modeled as being infinite. At least one of the parameters may correspond to the churn type of event. A likelihood of churn may be calculated for a plurality of the clients at one or more time points using the statistical model and its estimated parameters.