The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2013

Filed:

Feb. 28, 2008
Applicants:

Murray Cantor, Westwood, MA (US);

Sunita Chulani, San Jose, CA (US);

Robert Delmonico, White Plains, NY (US);

Vedakkedathu T. Rajan, Briarcliff Manor, NY (US);

Avik Sinha, New Rochelle, NY (US);

Giuseppe Valetto, New York, NY (US);

Mark N. Wegman, Ossining, NY (US);

Clay E. Williams, New York, NY (US);

Annie T. T. Ying, New York, NY (US);

Inventors:

Murray Cantor, Westwood, MA (US);

Sunita Chulani, San Jose, CA (US);

Robert Delmonico, White Plains, NY (US);

Vedakkedathu T. Rajan, Briarcliff Manor, NY (US);

Avik Sinha, New Rochelle, NY (US);

Giuseppe Valetto, New York, NY (US);

Mark N. Wegman, Ossining, NY (US);

Clay E. Williams, New York, NY (US);

Annie T. T. Ying, New York, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2012.01); G06Q 40/00 (2012.01);
U.S. Cl.
CPC ...
Abstract

A method and system of reducing risk in the life cycle of a product, in one aspect, obtain one or more tasks required to achieve an overall task, determine risk impact of each task, the risk impact being an impact of each task on the likelihood of failure for the overall task and compute risk of overall task based on risk impacts of the tasks. The method and system utilize said risk impact of each task to schedule the tasks in such a way so as to reduce said risk of overall task as rapidly as possible.


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