The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2013

Filed:

Nov. 01, 2010
Applicants:

Osamu Satoh, Sagamihara, JP;

Yasushi Nakazato, Tokyo, JP;

Kohji Ue, Ebina, JP;

Mikiko Imazeki, Ebina, JP;

Masahide Yamashita, Tokyo, JP;

Jun Yamane, Yokohama, JP;

Inventors:

Osamu Satoh, Sagamihara, JP;

Yasushi Nakazato, Tokyo, JP;

Kohji Ue, Ebina, JP;

Mikiko Imazeki, Ebina, JP;

Masahide Yamashita, Tokyo, JP;

Jun Yamane, Yokohama, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A rotation measuring mechanism capable of measuring a rotation amount and a displacement amount of a rotary member in a direction perpendicular to the rotation axis is provided. An exemplary combination of the rotation measuring mechanism includes a detection target rotating in synchrony with the rotary member and range sensors. Each time the detection target rotates once, each sensor outputs one cycle of a sine wave. The amplitude of the sine wave output from the sensor varies in accordance with the displacement of the detection target together with the rotary member in the direction perpendicular to the axis, thereby obtaining the rotation amount and the displacement amount of the rotary member.


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