The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2013
Filed:
Jun. 03, 2011
Paul Kenneth Wolber, Los Altos Hills, CA (US);
Robert Page, San Jose, CA (US);
Paul Kenneth Wolber, Los Altos Hills, CA (US);
Robert Page, San Jose, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
Described herein is a method for identifying an aberrant feature on a nucleic acid array. In general terms, the method comprises: a) obtaining a log transformed normalized value indicating the amount of hybridization of a test sample to a first feature on the nucleic acid array; b) calculating a z-score for the first feature using: the log transformed normalized value; and the distribution of reference log transformed normalized values that indicate the amount of hybridization of control samples to the same feature on a plurality of reference arrays; and c) identifying the test feature as aberrant if it has a z-score that is above or below a defined threshold.