The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2013
Filed:
Mar. 03, 2009
Masafumi Uematsu, Nagasaki, JP;
Takashi Kitaoka, Nagasaki, JP;
Koji Nishida, Miyagi, JP;
Yuji Tanaka, Miyagi, JP;
Matsuhiko Nishizawa, Miyagi, JP;
Hirokazu Kaji, Miyagi, JP;
Soichiro Sekine, Miyagi, JP;
Masafumi Uematsu, Nagasaki, JP;
Takashi Kitaoka, Nagasaki, JP;
Koji Nishida, Miyagi, JP;
Yuji Tanaka, Miyagi, JP;
Matsuhiko Nishizawa, Miyagi, JP;
Hirokazu Kaji, Miyagi, JP;
Soichiro Sekine, Miyagi, JP;
Nagasaki University, Nagasaki-shi, JP;
Tohoku University, Sendai-shi, JP;
Abstract
The invention provides a method for evaluating a corneal disorder quantitatively and is applicable to living eyes. In particular, the invention provides a method for measuring a corneal transepithelial electric resistance, which method comprises: (1) a step of placing a first electrode on the cornea and a second electrode on the conjunctiva; and (2) a step of flowing an electric current between the first electrode and the second electrode to measure the electric resistance. The invention also provides a device for measuring a corneal transepithelial electric resistance value.