The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2013
Filed:
Apr. 12, 2007
Jin Seo Kim, Daejeon, KR;
Maeng Sub Cho, Daejeon, KR;
Bon Ki Koo, Daejeon, KR;
Electronics and Telecommunications Research Institute, Dae jeon, KR;
Abstract
An image inspection apparatus determines whether a test image is a copy of an original image. The image inspection apparatus includes an image group generation unit that determines one or more types of image transform, and transforms the original image according to the determined types of image transform to generate an original image group; a spatial color difference computing unit that transforms a color space of the generated original image group, and calculates first spatial color differences between the original image and images in the original image group to provide color difference data; an image inspection unit that receives the test image and the original image group to calculate second spatial color differences between the test image and the images in the original image group, and compares the second spatial color differences to the color difference data; and an inspection result output unit that outputs the comparison result.