The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2013
Filed:
Sep. 03, 2002
Michael Kaus, Hamburg, DE;
Juergen Weese, Henstedt-Ulzburg, DE;
Steven Lobregt, Eindhoven, NL;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
The invention relates to a method of measuring geometric variables of a three-dimensional structure contained in an object from at least on image representing the object, having the following steps:—use of a deformable first model describing the structure, the shape of which model can be described by parameters,—adjustment of the first model to the structure in the image,—determination of the parameters at which the first model exhibits optimum conformity with the structure,—use of a deformable second model describing the structure, which second model in shape corresponds to the first model, and which in addition contains at least one geometric variable,—modification of the second model according to the parameters determined, and—derivation of the geometric variable(s) from the modified second model.