The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2013
Filed:
Dec. 13, 2012
Fujifilm Corporation, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Recording and reading method for optical information recording medium comprising: recording layer having thickness not less than 2λ/n, where λ is wavelength of recording beam and n is refractive index of the recording layer, and configured to undergo a change in the refractive index by irradiation with the recording beam; and adjacent layer adjacent to the recording layer at a side opposite to an incident side, comprises the steps of: recording a recording spot by irradiating with the recording beam, while shifting focal position by offset amount d, which satisfies ωd3ω, where ωis radius of the recording spot, from interface between recording layer and adjacent layer toward the incident side at a time of recording, whereby the refractive index of recording layer changes at a recording position to record recording spot; and reading out the information by irradiating with reading beam, while bringing it into focus on the interface.