The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2013
Filed:
Mar. 10, 2010
Toshihito Kimura, Kanagawa-ken, JP;
Toshihito Kimura, Kanagawa-ken, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
A total reflection illuminated sensor chip is employed in a detecting method for detecting a detection target substance including the steps of: supplying a sample that includes the detection target substance onto a metal film formed on a surface of a dielectric prism, irradiating a measuring light beam onto the interface between the dielectric prism and the metal film such that conditions for total reflection are satisfied at the interface, and utilizing evanescent waves which are generated due to the irradiation of the measuring light beam to detect the detection target substance. Polishing streaks in the region of a metal film formation surface of the dielectric film, on which the metal film is formed, have directional properties with respect to a single direction.