The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2013

Filed:

Aug. 14, 2012
Applicants:

Mitsuhito Mase, Hamamatsu, JP;

Takashi Suzuki, Hamamatsu, JP;

Seiichiro Mizuno, Hamamatsu, JP;

Mitsutaka Takemura, Hamamatsu, JP;

Inventors:

Mitsuhito Mase, Hamamatsu, JP;

Takashi Suzuki, Hamamatsu, JP;

Seiichiro Mizuno, Hamamatsu, JP;

Mitsutaka Takemura, Hamamatsu, JP;

Assignee:

Hamamatsu Photonics K.K., Hamamatsu-shi, Shizuoka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

Two charge quantities (Q,Q) are output from respective pixels P (m,n) of the back-illuminated distance measuring sensoras signals d'(m,n) having the distance information. Since the respective pixels P (m,n) output signals d′(m,n) responsive to the distance to an object H as micro distance measuring sensors, a distance image of the object can be obtained as an aggregate of distance information to respective points on the object H if reflection light from the object H is imaged on the pickup areaB. If carriers generated at a deep portion in the semiconductor in response to incidence of near-infrared light for projection are led in a potential well provided in the vicinity of the carrier-generated position opposed to the light incident surface side, high-speed and accurate distance measurement is enabled.


Find Patent Forward Citations

Loading…