The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2013
Filed:
May. 29, 2009
Applicants:
Nelson Liang an Chang, San Jose, CA (US);
Niranjan Damera-venkata, Mountain View, CA (US);
Inventors:
Nelson Liang An Chang, San Jose, CA (US);
Niranjan Damera-Venkata, Mountain View, CA (US);
Assignee:
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/02 (2006.01); H04N 5/66 (2006.01); H04N 3/22 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for reducing view-dependent artifacts in a multi-projector system includes the steps of measuring, from multiple viewpoints, projection characteristics of an image projected by a multi-projector system, estimating view-dependent projection parameters that can reduce view-dependent artifacts, and computing rendering parameters for each projector so as to reduce the view-dependent artifacts.