The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2013

Filed:

Sep. 17, 2010
Applicants:

Etienne Rene Jarrier, Basingstoke, GB;

Steve David Hiner, Salisbury, GB;

Simon Charles Larcombe, Southampton, GB;

Inventors:

Etienne Rene Jarrier, Basingstoke, GB;

Steve David Hiner, Salisbury, GB;

Simon Charles Larcombe, Southampton, GB;

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A monitoring system for monitoring the integrity of a member disposed within a machine includes an image analyzer configured to receive image data from an imaging device and to determine an amount of radiation incident on one or more of one or more pixels of the imaging device. The monitoring system also includes a monitor coupled to the image analyzer and configured to generate an alarm in the event an amount of radiation on one or more of the one or more pixels exceeds a limit.


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Jarrier, Etienne. (2013). Member integrity monitoring system and method (U.S. Patent No. 8477043). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8477043

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