The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2013
Filed:
Mar. 12, 2009
Elmar Mayer, Nuβdorf, DE;
Thomas Schürmann, Rosenheim, DE;
Christoph Lingk, Traunstein, DE;
Dr. Johannes Heidenhain GmbH, Traunreut, DE;
Abstract
An angle-measuring device having a scanning device with which scanning of a closed serial first code and scanning of a closed serial second code is enabled, wherein a length of the closed serial second code is less than a length of the closed serial first code, and the closed serial first code and the closed serial second code have at least one common code section. The angle-measuring device includes a detector array for generating first and second sequences of code words of a predetermined scanning length upon scanning of the closed serial first code and second codes, respectively. The first sequence includes a first partial sequence and one common partial sequence, and wherein the common partial sequence is created upon scanning of the common code section. The second sequence includes a second partial sequence and the common partial sequence. The angle-measuring device further includes a decoding device designed for decoding the first and second sequences of code words, wherein the closed serial first and second codes as well as the predetermined scanning length are selected such that code words of the first and second sequences have a Hamming distance greater than 1.