The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2013

Filed:

May. 11, 2012
Applicants:

Sung Min Yoon, Daejeon, KR;

Shin Hyuk Yang, Yongin-si, KR;

Soon Won Jung, Daejeon, KR;

Seung Youl Kang, Daejeon, KR;

Doo Hee Cho, Daejeon, KR;

Chun Won Byun, Daejeon, KR;

Chi Sun Hwang, Daejeon, KR;

Byoung Gon Yu, Daejeon, KR;

Kyoung Ik Cho, Daejeon, KR;

Inventors:

Sung Min Yoon, Daejeon, KR;

Shin Hyuk Yang, Yongin-si, KR;

Soon Won Jung, Daejeon, KR;

Seung Youl Kang, Daejeon, KR;

Doo Hee Cho, Daejeon, KR;

Chun Won Byun, Daejeon, KR;

Chi Sun Hwang, Daejeon, KR;

Byoung Gon Yu, Daejeon, KR;

Kyoung Ik Cho, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 51/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are a transparent nonvolatile memory thin film transistor (TFT) and a method of manufacturing the same. The memory TFT includes source and drain electrodes disposed on a transparent substrate. A transparent semiconductor thin layer is disposed on the source and drain electrodes and the transparent substrate interposed between the source and drain electrodes. An organic ferroelectric thin layer is disposed on the transparent semiconductor thin layer. A gate electrode is disposed on the organic ferroelectric thin layer in alignment with the transparent semiconductor thin layer. Thus, the transparent nonvolatile memory TFT employs the organic ferroelectric thin layer, the oxide semiconductor thin layer, and auxiliary insulating layers disposed above and below the organic ferroelectric thin layer, thereby enabling low-cost manufacture of a transparent nonvolatile memory device capable of a low-temperature process.


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