The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2013

Filed:

May. 08, 2012
Applicant:

Tetsuma Yamakaji, Tokyo, JP;

Inventor:

Tetsuma Yamakaji, Tokyo, JP;

Assignee:

Hoya Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02C 7/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

More appropriate evaluation, design, and manufacture are made feasible by taking visual functions into consideration more appropriately. In order to achieve this object, in the present invention, provided is a spectacle lens evaluation method for evaluating spectacle lenses using a visual acuity function, characterized in that the visual acuity function includes relative accommodation power as a factor, the relative accommodation power referring to the range expressed in terms of diopter in which distinct vision is achieved while maintaining convergence of a gaze point.


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Yamakaji, Tetsuma. (2013). Spectacle lens evaluating method, spectacle lens designing method using same, spectacle lens manufacturing method, spectacle lens manufacturing system, and spectacle lens (U.S. Patent No. 8474975). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8474975

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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