The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2013
Filed:
Jan. 11, 2006
Jesse A. Noller, Hudson, MA (US);
Robert S. Mason, Jr., Uxbridge, MA (US);
Jesse A. Noller, Hudson, MA (US);
Robert S. Mason, Jr., Uxbridge, MA (US);
Hitachi Data Systems Corporation, Santa Clara, CA (US);
Abstract
An automated system randomly generates test cases for hardware or software quality assurance testing. A test case comprises a sequence of discrete, atomic steps (or 'building blocks'). A particular test case has a variable number of building blocks. The system takes a set of test actions and links them together to create a much larger library of test cases or 'chains.' The chains comprise a large number of random sequence tests that facilitate “chaos-like” or exploratory testing of the overall system under test. Upon execution in the system under test, the test case is considered successful if each building block in the chain executes successfully; if any building block fails, the test case, in its entirety, is considered a failure.