The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2013
Filed:
Jan. 06, 2011
Applicant:
Sreejit Chakravarty, Mountain View, CA (US);
Inventor:
Sreejit Chakravarty, Mountain View, CA (US);
Assignee:
LSI Corporation, Milpitas, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A stored-pattern logic self-test system includes a memory, a device under test and a test controller. The memory stores test pattern data including test stimuli. The device under test includes a scan chain and a test access port configurable to control operation of the scan chain. The test controller is configured to test the device under test by controlling the memory to output the test stimuli to the device under test. The test controller controls the test access port to load the test stimuli into the scan chain, and receives and evaluates response data from the device under test.