The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2013
Filed:
Nov. 02, 2009
Juan Liu, Milipitas, CA (US);
Johan DE Kleer, Los Altos, CA (US);
Lukas D. Kuhn, Palo Alto, CA (US);
Juan Liu, Milipitas, CA (US);
Johan de Kleer, Los Altos, CA (US);
Lukas D. Kuhn, Palo Alto, CA (US);
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Abstract
A computer based method and system for tiered inference multiple fault diagnosis is provided. The method includes using a computer processor to dissect a hypothesis space representing a production system having a plurality of production modules into tiers. Production modules in the current tier are partitioned into a group or a set of sub-groups. A fault diagnosis algorithm is applied to the group of each sub-group to identify an acceptable fault diagnosis. When no acceptable fault diagnosis is found, the process moves to the next tier to perform further investigations. The process continues to move to higher tiers until an acceptable fault diagnosis is obtained or the system instructs the process to end.