The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2013

Filed:

Sep. 24, 2010
Applicants:

Shantanu Rane, Cambridge, MA (US);

YE Wang, Brookline, MA (US);

Wei Sun, Cambridge, MA (US);

Prakash Ishwar, Brookline, MA (US);

Inventors:

Shantanu Rane, Cambridge, MA (US);

Ye Wang, Brookline, MA (US);

Wei Sun, Cambridge, MA (US);

Prakash Ishwar, Brookline, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/38 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of present invention disclose a system and a method for determining a result of a function applied to a first vector and a second vector, wherein the function is a normalized sum-type function. The first vector is stored at a first processor, and the second vector is stored at a second processor. The system and the method determine a joint empirical probability distribution (JEPD) of the first vector and the second vector using a secure multi-party computation. The function is determined as a normalized summation of products of values of the JEPD with corresponding values of the function.


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