The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2013

Filed:

Jun. 09, 2010
Applicants:

Chinmaya Kar, Bangalore, IN;

Venkataramana Bantwal Kini, Bangalore, IN;

Vedika Agrawal, Delhi, IN;

Meenakshi Sunderam, Bangalore, IN;

Inventors:

Chinmaya Kar, Bangalore, IN;

Venkataramana Bantwal Kini, Bangalore, IN;

Vedika Agrawal, Delhi, IN;

Meenakshi Sunderam, Bangalore, IN;

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 19/00 (2011.01); G01H 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system includes a subsystem interaction module device, which includes at least one interface configured to receive input signals associated with multiple components of a system. The subsystem interaction module device also includes at least one processing unit configured to identify a potential fault in one or more of the components using the input signals and to provide an indicator identifying the potential fault. The at least one processing unit is configured to identify the potential fault by: identifying conflicting frequencies that are associated with different faults in the components of the system; and determining a confidence level associated with the potential fault based on the conflicting frequencies.


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