The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2013
Filed:
Feb. 25, 2010
John C. Rasmus, Richmond, TX (US);
John P. Horkowitz, Sugar Land, TX (US);
Koji Ito, Sugar Land, TX (US);
Christian Stolte, Winsen, DE;
Shahzad Asif, Richmond, TX (US);
Bernadette Tabanou, Houston, TX (US);
Jacques R. Tabanou, Houston, TX (US);
John C. Rasmus, Richmond, TX (US);
John P. Horkowitz, Sugar Land, TX (US);
Koji Ito, Sugar Land, TX (US);
Christian Stolte, Winsen, DE;
Shahzad Asif, Richmond, TX (US);
Schlumberger Technology Corporation, Sugar Land, TX (US);
Abstract
A method for processing well logging data includes method dividing the well logging data into a number of constant dimensional effect segments, where each constant dimensional effect segment defines an interval having a similar dimensional effect on the log response. The well logging data is taken from a highly deviated well. The method further includes dividing the constant dimensional effect segments into a number of constant property intervals, each constant dimensional effect segment including at least one corresponding constant property interval, and each constant property interval defining a wellbore distance over which a formation property is substantially constant that results in a log response having a low variance. The method further includes providing the constant property intervals to an output device. The method further includes determining constant property intervals in 3D volume space projected them into true stratigraphic thickness, and providing the resulting log-squared data to the output device.