The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2013
Filed:
Sep. 30, 2010
Applicants:
Benjamin F. Lane, Grafton, MA (US);
Yaron Rachlin, Brookline, MA (US);
Juha-pekka J. Laine, Boston, MA (US);
Robin M. A. Dawson, Watertown, MA (US);
Christopher C. Yu, Belmont, MA (US);
Inventors:
Benjamin F. Lane, Grafton, MA (US);
Yaron Rachlin, Brookline, MA (US);
Juha-Pekka J. Laine, Boston, MA (US);
Robin M. A. Dawson, Watertown, MA (US);
Christopher C. Yu, Belmont, MA (US);
Assignee:
The Charles Stark Draper Laboratory, Inc., Cambridge, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract
In general, in one embodiment, a starfield image as seen by an object is analyzed. Compressive samples are taken of the starfield image and, in the compressed domain, processed to remove noise. Stars in the starfield image are identified and used to determine an attitude of the object.