The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2013

Filed:

Jan. 11, 2010
Applicants:

Daxa Neykumar Rughani, Hertfordshire, GB;

Martin Philip Gouch, Hertfordshire, GB;

Inventors:

Daxa Neykumar Rughani, Hertfordshire, GB;

Martin Philip Gouch, Hertfordshire, GB;

Assignee:

FFEI Limited, Hertfordshire, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In accordance with the present invention there is provided a method for controlling a microscope to scan a microscope slide. By analyzing an overview image it is determined quantatively which swathe contains the most image detail and an optimum scanning order can subsequently be determined relative to the swathe determined as having the most detail. By scanning the swathe with the most detail first a good focus characteristic can be established for a dynamic focussing system and prediction errors in the dynamic focus system are likely to be low when scanning subsequent swathes.


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