The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2013
Filed:
Aug. 11, 2010
Aichi Chien, Los Angeles, CA (US);
Bin Dong, La Jolla, CA (US);
Yu Mao, Minneapolis, MN (US);
Stanley J. Osher, Pacific Palisades, CA (US);
Aichi Chien, Los Angeles, CA (US);
Bin Dong, La Jolla, CA (US);
Yu Mao, Minneapolis, MN (US);
Stanley J. Osher, Pacific Palisades, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
A method and apparatus for volumetric image analysis and processing is described. Using the method and apparatus, it is possible to obtain geometrical information from multi-dimensional (3D or more) images. As long as an object can be reconstructed as a 3D object, regardless of the source of the images, the method and apparatus can be used to segment the target (in 3D) from the rest of the structure and to obtain the target's geometric information, such as volume and curvature.