The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2013

Filed:

Mar. 30, 2010
Applicants:

Hassan Tanbakuchi, Santa Rosa, CA (US);

Roger B. Stancliff, Santa Rosa, CA (US);

Timothy M. Graham, Santa Rosa, CA (US);

Wenhai Han, Chandler, AZ (US);

Inventors:

Hassan Tanbakuchi, Santa Rosa, CA (US);

Roger B. Stancliff, Santa Rosa, CA (US);

Timothy M. Graham, Santa Rosa, CA (US);

Wenhai Han, Chandler, AZ (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/302 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus comprises: a first signal source; a dopant profile measurement module (DPPM) configured to receive a portion of the signal from the signal source; a probe tip connected to the reflective coupler; a load connected in parallel with the probe tip; and a second signal source connected to a load, wherein the signal source is configured to provide an amplitude-modulated (AM) signal to the probe tip. A method is also described.


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