The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2013

Filed:

Aug. 30, 2010
Applicants:

Koki Sato, Shinagwa, JP;

Yasuyuki Miki, Tokyo, JP;

Keita Harada, Tokyo, JP;

Mitsuru Kobayashi, Tokyo, JP;

Hideo Miyazawa, Tokyo, JP;

Koki Takahashi, Tokyo, JP;

Inventors:

Koki Sato, Shinagwa, JP;

Yasuyuki Miki, Tokyo, JP;

Keita Harada, Tokyo, JP;

Mitsuru Kobayashi, Tokyo, JP;

Hideo Miyazawa, Tokyo, JP;

Koki Takahashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A probe is made to contact an electrode terminal in an electric circuit or an electronic part for an electric measurement of the electric circuit or the electronic part. The probe includes a terminal portion which is brought in contact with the electrode terminal at one end of the probe, a spring portion in which U-shaped unit portions are arrayed in a zigzag formation, and a housing portion which surrounds the spring portion. The probe is formed of a sheet of a sheet-metal plate which is bent multiple times, the sheet-metal plate having a predetermined configuration in which a portion corresponding to the terminal portion, a portion corresponding to the spring portion, and a portion corresponding to the housing portion are continuously linked together.


Find Patent Forward Citations

Loading…