The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2013

Filed:

Jul. 01, 2011
Applicants:

Warrick Paul Chisholm, Cannington, AU;

Laurence Drew Mann, Cannington, AU;

Timothy Rayner, San Diego, CA (US);

John Alec Sidney Smith, Greater London, GB;

Inventors:

Warrick Paul Chisholm, Cannington, AU;

Laurence Drew Mann, Cannington, AU;

Timothy Rayner, San Diego, CA (US);

John Alec Sidney Smith, Greater London, GB;

Assignee:

Rapiscan Systems, Inc., Torrance, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present application discloses systems and methods for analyzing a chemical substance containing quadrupolar nuclei to determine a measurable characteristic of the substance. The systems and methods include irradiating the substance with RF energy to stimulate NQR of certain quadrupolar nuclei within the substance, receiving and processing a signal emitted from the substance to isolate an NQR signal therefrom, analyzing the NQR signal to obtain a measure of the characteristic of the substance, and providing an output indicative of the measure for analytical purposes.


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