The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2013

Filed:

Sep. 12, 2009
Applicants:

Christoph Bert, Aschaffenburg, DE;

Thomas Haberer, Frankfurt, DE;

Eike Rietzel, Weiterstadt, DE;

Inventors:

Christoph Bert, Aschaffenburg, DE;

Thomas Haberer, Frankfurt, DE;

Eike Rietzel, Weiterstadt, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61N 5/10 (2006.01); A61N 5/00 (2006.01); G21K 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention concerns a method for irradiating a target with a beam approaching target points, involving the following steps: Measuring at least one of the parameters relating to the position of the beam and the intensity of the beam, changing the beam as a function of the at least one measured parameter, particularly as a function of a variance relating to the at least one measured parameter. The method is characterized in that the at least one measured parameter is measured at the most once per target point. Furthermore, the invention concerns a device for irradiating a target in accordance with the invention-based method and a control system for controlling such a device.


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