The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2013

Filed:

Oct. 15, 2008
Applicants:

Takashi Takebe, Tama, JP;

Masataka Takimoto, Machida, JP;

Nobuo Kubo, Hachioji, JP;

Inventors:

Takashi Takebe, Tama, JP;

Masataka Takimoto, Machida, JP;

Nobuo Kubo, Hachioji, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 27/00 (2006.01); C09K 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An acryl resin-containing film which is transparent and highly heat-resistant and has been significantly improved in brittleness is disclosed, satisfying the following equations (1) to (4), exhibiting a tension softening point of 105 to 145° C. and a photoelastic coefficient of −5.0×10to 8.0×10cm/N, while causing no ductile fracture. There is also disclosed a liquid crystal display which has achieved an improved yield in works of stamping a polarizing plate or sticking the plate to a panel and reduced color shift occurred depending on viewing angle.|(589)|≦10 nm  Equation (1)|(589)|≦20 nm  Equation (2)|(480)−(630)|≦5 nm  Equation (3)|(480)−(630)|≦10 nm  Equation (4) Numerical values of 589, 480 and 630 in parentheses represent the wavelength (nm) of a light used to measure an individual birefringence.


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