The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2013
Filed:
Oct. 23, 2009
Chun-shun Tseng, Keelung, TW;
Ya-yun Jheng, Taipei County, TW;
Ming-chi Jhuang, Keelung, TW;
Shih-hsun Chen, Taipei County, TW;
Hai-peng Cheng, Taipei County, TW;
Te-heng Hsiang, Taipei County, TW;
Jung-hua Wang, Keelung, TW;
Chun-Shun Tseng, Keelung, TW;
Ya-Yun Jheng, Taipei County, TW;
Ming-Chi Jhuang, Keelung, TW;
Shih-Hsun Chen, Taipei County, TW;
Hai-Peng Cheng, Taipei County, TW;
Te-Heng Hsiang, Taipei County, TW;
Jung-Hua Wang, Keelung, TW;
Armorlink SH Corp., Min-Sing-Sin-Jhuang Industrial District, Shang-Hai, unknown;
ICP Electronics, Inc., Xizhi Dist., New Taipei, TW;
Abstract
A method for fast locating a decipherable pattern in an input image, which is characterized in utilizing an overly downscaled binary image to not only reduce computation time but also facilitate extraction of skeletons for fast and accurately locating pattern, is disclosed. First, a pre-process is applied to an input image to acquire a binary image downscaled n times, from which at least one skeleton corresponding to a decipherable pattern is extracted. Coordinate values of at least one pixel of each skeleton are respectively enlarged ntimes and used as the central points on the original image plane for establishing a plurality of detecting blocks with the identical size. Subsequently, a grading mechanism is employed to determine the corresponding detecting blocks of the decipherable pattern.