The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2013

Filed:

Sep. 01, 2009
Applicants:

Frank Schubert, Dresden, DE;

Abdelmalek Bouhadjera, Jijel, DZ;

Inventors:

Frank Schubert, Dresden, DE;

Abdelmalek Bouhadjera, Jijel, DZ;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/07 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus provides for the non-destructive testing of samples. The samples can in this respect also be formed from critical materials which change their properties during manufacture, for example on a hardening or solidification. In an apparatus in accordance with the invention, at least one ultrasonic pressure wave transducer is arranged at a forward cell. The forward cell is filled with a liquid and is placed with an open side at one side onto a surface (A) of a conversion prism, in the form of a solid body, so that the liquid and the surface (A) are in touching contact. The conversion prism is placed with a further surface (B) onto a surface of a sample to be tested. At least one ultrasonic pressure wave transducer can be positioned or is positioned at the forward cell at at least two positions (T, T) so that the positions are arranged at an equal spacing from the center of the surface (A) of the conversion prism, said surface being placed onto the sample.


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