The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2013
Filed:
Jul. 08, 2010
Radislav A. Potyrailo, Niskayuna, NY (US);
Vincent F. Pizzi, Millis, MA (US);
Hua Wang, Clifton Park, NY (US);
Radislav A. Potyrailo, Niskayuna, NY (US);
Vincent F. Pizzi, Millis, MA (US);
Hua Wang, Clifton Park, NY (US);
GE Healthcare Bio-Sciences Corp., Piscataway, NJ (US);
Abstract
A system for measuring parameters in a container is disclosed. A system for measuring multiple parameters includes a container having a solution, at least one sensor in conjunction with a tag is in proximity to an impedance analyzer and a reader that constitute a measurement device. The at least one sensor is configured to determine at least one parameter of the solution. The tag is configured to provide a digital ID associated with the sensor, where the container is in proximity to the reader and an impedance analyzer. The impedance analyzer is configured to send and receive a given range of frequencies from the sensor, based on the parameter and calculate parameter changes based on the response.