The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2013
Filed:
May. 26, 2008
Fumikazu Ebara, Saitama, JP;
Fumikazu Ebara, Saitama, JP;
Kosaka Laboratory Ltd., Tokyo, JP;
Abstract
A method of calibrating a group of parameters of an articulated coordinate measuring apparatus includes the use of primary and secondary standard units. These standard units each include one or more calibration reference portions, and the group of parameters include primary and secondary calibration parameters. Space coordinates of each reference portion of the primary standard unit is measured at a plurality of arm positions of the apparatus, and calibration is performed for the primary calibration parameters based on the measurements. Space coordinates of the reference portions of secondary standard unit is then measured and parameter calibration is performed for the secondary calibration parameters based on these measurements.
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