The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2013
Filed:
Oct. 24, 2011
Nathan C. Buck, Underhill, VT (US);
Brian M. Dreibelbis, Underhill, VT (US);
John P. Dubuque, Jericho, VT (US);
Eric A. Foreman, Fairfax, VT (US);
Peter A. Habitz, Hinesburg, VT (US);
Jeffrey G. Hemmett, St. George, VT (US);
Natesan Venkateswaran, Hopewell Junction, NY (US);
Chandramouli Visweswariah, Croton-on-Hudson, NY (US);
Xiaoyue Wang, Kanata, CA;
Vladimir Zolotov, Putnam Valley, NY (US);
Nathan C. Buck, Underhill, VT (US);
Brian M. Dreibelbis, Underhill, VT (US);
John P. Dubuque, Jericho, VT (US);
Eric A. Foreman, Fairfax, VT (US);
Peter A. Habitz, Hinesburg, VT (US);
Jeffrey G. Hemmett, St. George, VT (US);
Natesan Venkateswaran, Hopewell Junction, NY (US);
Chandramouli Visweswariah, Croton-on-Hudson, NY (US);
Xiaoyue Wang, Kanata, CA;
Vladimir Zolotov, Putnam Valley, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
In embodiments of a statistical static timing analysis (SSTA) method, system and program storage device, the interdependence between the setup time and hold time margins of a circuit block (e.g., a latch, flip-flop, etc., which requires the checking of setup and hold timing constraints) is determined, taking into account possible variations in multiple parameters (e.g., using a variation-aware characterizing technique). A parameterized statistical static timing analysis (SSTA) of a circuit incorporating the circuit block is performed in order to determine, in statistical parameterized form, setup and hold times for the circuit block. Based on the interdependence between the setup and hold time margins, setup and hold time constraints can be determined in statistical parameterized form. Finally, the setup and hold times determined during the SSTA can be checked against the setup and hold time constraints to determine, if the time constraints are violated or not and to what degree.