The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2013

Filed:

Jan. 05, 2010
Applicants:

Toshiyuki Maeda, Kanagawa, JP;

Yoshiyuki Nakamura, Kanagawa, JP;

Inventors:

Toshiyuki Maeda, Kanagawa, JP;

Yoshiyuki Nakamura, Kanagawa, JP;

Assignee:

Renesas Electronics Corporation, Kawasaki-Shi, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test circuit includes a plurality of TAP controllers conforming to a standard specification defined in IEEE 1149 and includes a master TAP controller which receives a control code and a test control signal and performs a test on a circuit to be tested and which outputs a shift mode signal, a first slave TAP controller which receives the control code and the test control signal and performs a test on a circuit to be tested, and a first TAP pin control circuit provided to correspond to the first slave TAP controller and which switches between inputting the control code to the first slave TAP controller from the outside and inputting the control code through the master TAP controller, on the basis of the shift mode signal.


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